Flexible Bluetooth LE HCI/LL Tester

The testHarmony LE Exerciser is a highly flexible test solution designed to provide debugging, regression and robustness testing for chipset vendors and product manufacturers during the development cycle and post release.

The exerciser supports test case package licenses based on Bluetooth feature group functionality or TCRL releases. The test case packages are available either individually or as a complete package. testHarmony supports a subset of parameterized test cases that enable the user to change specific test case parameters to test above and beyond the Bluetooth SIG LE specification. With the purchase of testHarmony and at least one test case package the user will also get access to a set of custom test cases that are not part of the specification.

The Test Manager is responsible for test execution, results logging, and running test scripts. Test execution is automated, which allows the system to be integrated into automated regression test systems where no operator intervention is required in order to execute a test suite and parse the pass/fail results. Automated error recovery of the IUT from failures during testing prevents a cascade of failures due to a previous test, limiting failures to just the test that caused the IUT to fail.

The Upper Tester interfaces to the IUT (Implementation Under Test) via HCI UART.

The Lower Tester interfaces to the IUT via RF over the air and RF conducted.

• HCI and over-the-air capture files via X240 Protocol analyzer
• Complete log of test case validations and verdicts

The Frontline X240 Wireless Protocol Analyzer is available as an option for testHarmony to capture Over The Air (OTA) data to support test cases that require OTA verification.

• Provides regression testing of Bluetooth low energy HCI and Link Layer implementations
• Supports test case packages based on Bluetooth feature groups or TCRL releases
• Parameterized test cases - enables the user to change the parameters of subset of test cases to test beyond Bluetooth SIG specification
• Export test results for individual runs or across multiple runs within the same test project for detailed comparison
• Flexible test configuration supports multiple IUTs
• Summarizes and pinpoints root cause of a fail or inconclusive result
• Allows for integration into "no operator required" automated test regression systems
• User can customize test runs based on individual features or full test runs
• Test Manager, Upper Tester and Lower Tester in one small, portable platform
• Automated error recovery of IUT from failures during testing prevents cascade of failures and "false-negatives"