Software Options


DDR4, LPDDR4 and LPDDR4X are evolutionary upgrades from previous generations of DDR3 and LPDDR3. It introduces data transfer rates which are nearly double the previous transfer rates, ranging from 1.6 GT/s up to 4.2 GT/s. DDR4's higher transfer rates and lower operating voltage have driven new test methodologies and test requirements which were not previously required to ensure proper signal fidelity. QPHY-DDR4 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification which will aid in DDR4, LPDDR4 and LPDDR4X design validation. Meanwhile the Debug Toolkit is a separate tool that assists with turn-on, multi-scenario debug and is a great assisting toolset whenever you need to manually dig a little deeper.

Explore QPHY-DDR4 Explore QPHY-DDR4
Key Features
  • Complete DDR4, LPDDR4 and LPDDR4X test coverage as described by JESD79-4D, JESD209-4D and JESD209-4-1A
  • Support for all standard and custom speed grades
  • Separate burst using DQ-DQS phase or DDR4/LPDDR4/4X command bus decode
  • Statistically relevant results achieve measurement confidence
  • Report generation with pass/fail results and fully annotated worst case measurement screenshot
  • DDR Debug Toolkit integration for easy and flexible debug
  • Maximize signal integrity with de-embedding and Virtual Probing

Accurate Burst Separation

Read and Write bursts can be separated based on DQ-DQS phase or based on the command bus when used in conjunction with the HDA125 High-speed Digital Analyzer. The HDA125 enables bursts to be separated using the commands sent from the controller, allowing for accurate burst separation even in situations with non-ideal signal integrity (e.g. reflections).

Measurement Confidence

Due to the high level of variability in DDR measurements, it is important to make statistically relevant measurements to fully characterize DDR4, LPDDR4 or LPDDR4X memory interfaces. By measuring thousands of cycles in one acquisition, the user can be more confident that they are catching the true maximum and minimum points for their measurement.

Most Flexible DDR4 and LPDDR4 Debug

QPHY-DDR4 uses the DDR Debug Toolkit to perform all compliance testing. Using the “Stop on Test” feature, the user can pause testing after each individual test and clearly see where the worst case measurement occurred. At that point the DDR Debug toolkit can be leveraged for further debug and upon completion, testing can be seamlessly resumed with one click of a button.

De-embedding and Virtual Probing

Teledyne LeCroy provides software tools which can be used to maximize signal integrity with DDR probing. The VirtualProbe package can virtually move the probe to the DRAM BGA, where it cannot be physical placed, and it will remove any effects of the probe or interposers through de-embedding. The VP@Rcvr (Virtual Probe at Receiver) math function can be used to model the circuit of the DIMM to reduce reflections.

DQ Input Receiver Compliance Mask

The DDR4, LPDDR4/4X specifications include compliance test masks for the DQ input signal which replaces the traditional DQ setup and hold time measurements from previous standards. QPHY-DDR4 automatically centers the mask in the DQ eye to test for any mask hits and reports the required shift from the DQS crossing to test measurements like tDQS2DQ. This eye diagram is also used to calculate the VIHL_AC style peak to peak requirements outlined by the JEDEC standard.

Clock Tests

The DDR4 specification requires clock jitter to be separated into random and deterministic components, which is a first for DDR specifications. QPHY-DDR4 leverages industry leading serial data algorithms to perform the jitter breakdown for tJIT(per). In addition to these tests, QPHY-DDR4 will test average clock period, absolute clock period, average high/low pulse width, absolute high/low pulse width, cycle-cycle jitter, duty cycle jitter, and cumulative error over n period tests.

Timing Tests

tDQSQ verifies the skew between DQS and the associated DQ within a read burst. QPHY-DDR4 will perform this measurement on every DQ transition within a read burst. Upon completion each test will display a fully annotated "worst case measurement" screenshot which includes trace labels for the signals under test and relevant voltage levels.

Electrical Tests

The differential and single-ended slew rates defined by the JEDEC standards for DDR4/LPDDR4/4X measure every rising and falling edge within a write burst. QPHY-DDR4 will measure every transition within each write burst in the acquisition providing large statistically results in a short period of time. In this picture over 3,000 slew rate measurements were performed which ensures that the true maximum and minimum points have been caught without requiring multiple acquisitions.


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