DDR Debug Toolkit

• Read/Write burst separation with a push of a button
• Simultaneous analysis of four different measurement views
• View up to 10 eye diagrams with mask testing and eye measurements
• Searchable Bus State views with intuitive color-coded overlays
• Perform jitter analysis for root cause analysis
• Quickly configure measurements specific to DDR
• Analyze specific regions of bursts with configurable qualifiers
• Support for DDR2/3/3L/4/5 and LPDDR2/3/4/4X
• Select standard and custom speed grades

Automatically separate Read and Write bursts with the DDR Debug Toolkit, eliminating the time-consuming process of manual burst identification and simplifying the analysis of DDR system performance and validation. Bursts can be separated based on DQ-DQS phase or based on the command bus when used in conjunction with the HDA125.

The DDR Debug Toolkit can quickly create and display up to 10 eye diagrams simultaneously with a push of a button. Visual inspection and analysis of side-by-side eye diagrams can provide valuable skew and timing information. Choosing to have CK or DQS as the timing reference provides two different vantage points of system performance.

Any DQ, DQS or command/address signal can be tested against a standard or a custom defined mask. Enabling mask failure indicators will automatically identify any mask violations and locate the specific UI where any mask violation occurred. Built-in measurements such as eye height, eye width and eye opening are critical to gaining a quantitative understanding of the system performance. With simultaneous eye measurements it is easy to compare performance across multiple testing views.

Bursted DDR signals create undesirable complications and challenges for traditional serial data analysis and jitter tools preventing analysis of DQ, DQS and address signals. Jitter parameters including Tj, Rj, and Dj are calculated across all active DDR measurement views. To gain a deeper understanding of the jitter distribution, traditional displays such as TIE histograms, TIE track, and bathtub curves are available.

With a toolbox of parameters specific to DDR it is simple to quickly configure insightful measurements for validation, characterization, and debug. Up to 12 configurable measurements can be displayed and analyzed simultaneously across all active measurement views. For each measurement, advanced statistics such as min, max, mean, and number of measurement instances can be displayed and easily located with the searchable zoom feature.

When configuring a measurement, each view can be independently assigned a signal to be analyzed, providing extensive flexibility for analysis. For example, it is simple to setup a comparison of system performance between read and write burst operation across multiple DQ lanes. Simultaneous analysis of up to four measurement views simplifies the measurement process and eliminates concerns about making unsynchronized measurements.

The reference view allows engineers to easily conduct performance tuning or optimization tests. The user is able to store any view into a reference view, then make a change to their setup to observe a change in any performance characteristics. Measurements can be added or removed from the reference view at any time so there is no need to worry about having all analysis parameters defined at the beginning of testing.

Using built-in configurable qualifiers, all of the analysis in the DDR Debug Toolkit can be gated to include or ignore the first “n” bits. This allows for a deep understanding of how the system is performing under specific conditions. For example, this type of analysis can be used to gain knowledge about how the system is functioning coming out of preamble or exclusively in the middle of burst operation.