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An AWG and oscilloscope form the foundation of a versatile stimulus-response measurement system capable of addressing a wide range of characterization and validation challenges. This application note reviews the critical specifications that influence measurement performance, such as vertical resolution, waveform memory depth, and signal integrity. It then illustrates how these instruments work together in real-world test scenarios, providing practical examples that highlight the advantages of stimulus response testing for component, circuit, and system analysis.
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This application note analyzes the architectural differences between Function Generators and Arbitrary Waveform Generators, focusing on DDS-based FG designs versus true-arb AWG implementations using high speed DACs and deep memory. It examines key parameters such as bandwidth, sampling rate, resolution, and signal fidelity, and identifies optimal use cases. The T3AWG series integrates both FG and AWG modes within a single platform, enabling operation across a wide range of test requirements.
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