High Bandwidth,
Uniquely Versatile

WaveMaster 8 Zi-B oscilloscopes are uniquely versatile for general-purpose testing with the bandwidth and tools necessary for serial data link analysis and DDR testing.

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Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope with both 50 Ohm and 1 Megohm inputs showing two eye diagrams and serial data jitter deconvolution.
Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope with the most capability - both 50 Ohm and 1 Megohm inputs, wide probe support, mixed-signal acquisitions, and low-speed serial triggering and decoding.

Most Capability

  • Both 50 Ω and 1 MΩ inputs for widest probe support
  • Mixed-signal acquisition capability
  • Comprehensive serial triggering and decoding
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Iconic representation of high-speed serial data test tools - QualiPHY compliance test automation, DDR, and serial data test.

Best for Serial Data and DDR

  • Simple and powerful compliance test automation
  • Interactive DDR debug toolkit
  • Most complete eye diagram, jitter and noise analysis
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End-to-end link signal integrity analysis for Teledyne LeCroy WaveMaster 8 Zi-B oscilloscopes using WavePulser 40iX and other tools.

Analyze the Whole Link

  • Import S-parameter files from WavePulser 40iX
  • De-embed fixtures and emulate channels
  • Measure transmitter and receiver equalization effects
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Most Capability

WaveMaster 8 Zi-B oscilloscopes' unique combination of high-bandwidth performance (up to 16 GHz) and general-purpose features enables the most comprehensive validation and debug capabilities.

Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope testing circuit board with passive probe, current probe, active FET probe, and high-bandwidth differential probe.

50 Ω and 1 MΩ inputs for Widest Probe Support

WaveMaster is the only high-bandwidth oscilloscope to also provide built-in 1 MΩ inputs. This permits direct connection of passive probes, and support for the widest variety of low voltage, high voltage and current probes, all without requiring the use of expensive, add-on external adapters.

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Mixed-signal Acquisitions, Low- and High-speed

Expand your acquisition reach with mixed-signal options for low-speed digital acquisitions with up to 36 channels and 500 MHz digital clock rates or high-speed digital acquisitions with up to 18 channels and 6 Gb/s digital clock rates.

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Comprehensive Serial Data Triggers/Decoders

Comprehensive low-speed serial data triggers and decoders, plus measure/ graph and eye diagram testing, provide the best causal analysis of low-speed events. Easily correlate low-speed serial interactions with high-speed serial data or other events.

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Best for Serial Data and DDR

The WaveMaster 8 Zi-B is the best oscilloscope platform for high-speed serial data and memory compliance and debug.

Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope performing serial data and DDR tests on motherboard using HDA125 high-speed digital analyzer and DH Series 8-30 GHz differential probes.
Teledyne LeCroy QualiPHY automated compliance testing main dialog.

QualiPHY Automated Compliance Testing

  • Support for PCI Express®, USB, HDMI™, DisplayPort™, Ethernet, Automotive Ethernet, DDR, and many other serial data standards
  • Fully automated transmitter and receiver testing and receiver test calibration
  • Step-by-step instructions and automatic report generation
  • Automated pass/fail test reports

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SDA Expert serial data analysis NRZ eye diagram, jitter histogram, jitter track, jitter FFT and random, deterministic and total jitter measurements

Simplified Serial Data Expertise

  • Tailored technology analysis for PCI Express, USB, DisplayPort and more
  • Most complete serial data analysis toolbox
  • Highest confidence for complex measurements

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ddr image

Fastest Journey from DDR Turn-on Through Compliance Testing

  • Maximize DDR operation from initial turn-on through validation
  • Accelerate DDR pre-compliance testing and fine tuning
  • Comprehensive DDR compliance testing

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Analyze the Whole Link

Combining the WavePulser 40iX High-speed Interconnect Analyzer, WaveMaster 8 Zi-B oscilloscope and SDA Expert option gives the most complete signal integrity analysis toolkit available.

Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope used with WavePulser 40iX High-speed Interconnect Analyzer for serial data link analysis.
De-embedding of fixtures and test cables from TP1 to TP2 using WavePulser 40iX S-parameters and WaveMaster 8 Zi-B toolsets.

De-embed Fixtures and Test Cables

  • Import S-parameters from LeCroy WavePulser 40iX or other tools
  • Use Eye Doctor and Virtual Probe tools to easily and accurately remove effects of fixtures and cables
  • Apply the full SDA Expert toolkit to de-embedded waveforms for full eye, jitter and noise analysis directly at the output pins of the device under test
Emulation of real-world channel losses from TP2 to TP3 using WavePulser 40iX S-parameters and WaveMaster 8 Zi-B toolsets.

Emulate Real-world Channel Losses

  • WavePulser 40iX simplifies and speeds up accurate measurements of test channel loss profiles
  • Acquire waveforms at any point in the signal path, then embed the effects of the channel
  • Compare eye, jitter and noise measurements at multiple test points simultaneously
Emulation of transmitter and receiver equalization by probing at TP1 and emulating at TP3 using WavePulser 40iX S-parameters and WaveMaster 8 Zi-B toolsets.

Emulate Tx and Rx Equalization

  • SDA Expert with Eye Doctor enables the emulation of all common equalization types, including:
    — Transmitter emphasis
    — Receiver FFE
    — Receiver CTLE
    — Receiver DFE

PCIe Testing That Crosses The Layers

Teledyne LeCroy's PCI Express electrical test solutions combine superior instruments with sophisticated analysis software.

  • Simplified PCIe link testing
  • Most confidence for PCIe testing
  • Built-in PCIe expertise using SDA Expert
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Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope and Anritsu MP1900A BERT with PCI Express add-in card attached to printed to circuit board.
Teledyne LeCroy WaveMaster 8 Zi-B oscilloscope and WavePulser 40iX with Anritsu MP1900A BERT and an assortment of USB test fixtures.

USB and USB-CElectrical Test Leadership – From PHY to Protocol

Complete PHY and PHY-logic layer oscilloscope solutions for USB 3.2, USB 2.0, USB Power Delivery, all over the USB Type-C®.

  • The best oscilloscope for USB-C testing
  • Built-in USB-C test expertise for measuring and characterizing signals
  • Simplify USB-C link testing with cross-layer analysis
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