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Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
The R-Series 3U Rackmount Appliance for PCIe Gen4 is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA. As the name implies, the 3U Rackmount Appliance fits in a standard 19-inch rack enclosure at a 3U height. The 3U Rackmount Appliance is powered by the OakGate Storage Validation Framework Pro
engine, the industry’s most advanced storage-testing software. The robust SVF Pro software, now in its fourth generation, offers a comprehensive set of testing features and capabilities.
The OGT-R300-G4 is designed to meet the demands for high-density scaling with its seven internal motherboard PCIe slots (four Gen4 x16, one Gen4 x8, and two shared Gen3 (two at x8 and x8 or two at x16 and x0)). These slots can be used as expansion slots to connect to a variety of external enclosures, such as the
OakGate 12-bay enclosures that
test U.2, U.3, or EDSFF 1U SSDs. The slots can also be used for "in-appliance" testing, such as testing NVMe add-in cards or connecting to the optional OakGate 4-bay plug-in modules to test U.2, U.3, or EDSFF 1U short SSDs. The following figure shows the appliance equipped with an
OakGate 4-Bay U.2 Plug-In Module and
OakGate 4-Bay EDSFF 1U Short Plug-In Module
to test U.2 and EDSFF 1U short SSDs, respectively.
Enjoy the satisfaction of having builtin support for the storage industry's most popular and emerging protocols.
Easily generate high-performance, randomized traffic profiles with I/O profiles. Includes support for Zoned Namespace.
Effectively debug and analyze from early prototype bring-up through long-term I/O testing using the embedded protocol analyzer.
Execute hundreds of built-in conformance tests that evaluate a device against its protocol, or create your own for maximum flexibility and control. OCP 1.0 supported.
Inject error conditions to see how the DUT behaves in real-life situations.
Test your product's true limits with our industry-leading multi-vendor support for peripheral control and power management.
Create full automation suites without writing a single line of code using our integrated test automation tool.
Deliver consistent benchmarking results, measure the true performance of the device under test, and generate a suite of performance analytics.
Build confidence that your device behaves as intended and unconditionally keeps data intact, even under the most stressful power-loss situations.
PCI Express® 4.0 (PCIe Gen4) compatible
Powered by the SVF Pro / Enduro software
AMD EPYC™ 7402P, 24 Core Processor, singlesocket, 2.8 GHz
64GB DDR4 ECC system memory (up to 512GB)
Four PCIe Gen4 x16 (slots 3, 4, 6, and 7)
One PCIe Gen4 x8 (slot 5)*
One PCIe Gen3 x8 or x0 (slot 2)*
One PCIe Gen3 x8 or x16 (slot 1)*
*Slots 2 and 1 are shared, such that slots 2 and 1 can be x8 and x8, respectively, or x0 and x16, respectively.
Provides support for up to two 4-bay plug-in modules for testing U.2, U.3, or EDSFF 1U short SSDs
Ability to run unique tests on each SSD individually and concurrently
Support 3.3V, 5V, and 12V
Power on/off to each port/device
Voltage and current measurement for each port/device (at a sample rate of approximately one read per second)
Power measurement under various low power states (at a sample rate of approximately one read per second)
~ 19" W × 26" L x 5.5” H