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Oscilloscope Probes
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DL07-ISO

The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.


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Key Features
  • 1 GHz bandwidth
  • Ideal for GaN and SiC devices
  • 1.5% system accuracy
  • 435 ps rise time
  • High CMRR - 160 dB
  • Flexible connectivity options
  • Autozero without disconnection

 

Highest Accuracy

Combine DL-ISO probes with industry-leading 12-bit resolution High Definition Oscilloscopes (HDOs) to get 1.5% system accuracy, nearly twice as good as the alternate solution in the market.

Best Signal Fidelity

DL-ISO delivers the industry's best signal fidelity with the fastest rise time, lowest overshoot, and low DUT loading.

Comprehensive Connectivity

DL-ISO probes employ high-quality coaxial attenuating tips that reject unwanted noise and terminate into test boards using industry standard MMCX connectors or high-voltage safe square pin headers.

Flexible In-Circuit Debug

Device-Power software automatically calculates various device losses as defined by JEDEC®.