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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
High Voltage Optically Isolated Probes
Combine DL-ISO probes with industry-leading 12-bit resolution High Definition Oscilloscopes (HDOs) to get 1.5% system accuracy, nearly twice as good as the alternate solution in the market.
DL-ISO delivers the industry's best signal fidelity with the fastest rise time, lowest overshoot, and low DUT loading.
DL-ISO probes employ high-quality coaxial attenuating tips that reject unwanted noise and terminate into test boards using industry standard MMCX connectors or high-voltage safe square pin headers.
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