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This application note analyzes the architectural differences between Function Generators and Arbitrary Waveform Generators, focusing on DDS-based FG designs versus true-arb AWG implementations using high speed DACs and deep memory. It examines key parameters such as bandwidth, sampling rate, resolution, and signal fidelity, and identifies optimal use cases. The T3AWG series integrates both FG and AWG modes within a single platform, enabling operation across a wide range of test requirements.
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