This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Kenneth Johnson has managed oscilloscope and probe product lines, power applications and HV T&M equipment. He holds a B.S.E.E. from Rensselaer Polytechnic Institute. He enjoys playing ice hockey, cross-country skiing and bicycling in his spare time.
Power conversion relies on fast-switching MOSFETs and IGBTs that use low-voltage gate-drive signals to control high-voltage, high-current switching efficiently.
While built-in isolated inputs offer convenience and safety, high-quality isolated probes deliver superior noise immunity and performance in fast-switching, high-voltage environments.
A simple in-circuit test reveals how a differential probe’s CMRR behaves across frequencies and how closely it matches published specifications in real measurement environments.
