This article explains how the inductance of passive probe ground leads can dramatically reduce effective bandwidth, distort measurements, and introduce resonance and frequency-response errors.
This tutorial explains a robust oscilloscope-based method for measuring clock jitter using period statistics, track and histogram analysis, and sample-rate verification techniques.
This article introduces the RP2060 and RP4060 power rail probes, designed for modern 48 V power architectures with high offset capability, low-noise measurements, and high-bandwidth power integrity analysis.
Guidance on selecting, configuring, and using probes for accurate high-fidelity measurements. Covers probe loading, bandwidth considerations, grounding techniques, and common measurement mistakes.
This article explains how the inductance of passive probe ground leads can dramatically reduce effective bandwidth, distort measurements, and introduce resonance and frequency-response errors.
This article introduces the RP2060 and RP4060 power rail probes, designed for modern 48 V power architectures with high offset capability, low-noise measurements, and high-bandwidth power integrity analysis.
Attaching multiple probes to the same test point can cause probe loading and interference, leading to inaccurate oscilloscope measurements and distorted waveforms.
While built-in isolated inputs offer convenience and safety, high-quality isolated probes deliver superior noise immunity and performance in fast-switching, high-voltage environments.
These nine practical DDR probing tips help reduce strain, improve signal integrity, and avoid common measurement pitfalls when working with high-speed DRAM interfaces.
A simple in-circuit test reveals how a differential probe’s CMRR behaves across frequencies and how closely it matches published specifications in real measurement environments.
