This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Guidance on selecting, configuring, and using probes for accurate high-fidelity measurements. Covers probe loading, bandwidth considerations, grounding techniques, and common measurement mistakes.
A simple in-circuit test reveals how a differential probe’s CMRR behaves across frequencies and how closely it matches published specifications in real measurement environments.
What if we remove the probes from the equation by connecting our DUT's output directly to the oscilloscope's analog input using a 3-ft. 50-Ω coaxial cable?
