This article explains how the inductance of passive probe ground leads can dramatically reduce effective bandwidth, distort measurements, and introduce resonance and frequency-response errors.
This tutorial explains a robust oscilloscope-based method for measuring clock jitter using period statistics, track and histogram analysis, and sample-rate verification techniques.
This article introduces the RP2060 and RP4060 power rail probes, designed for modern 48 V power architectures with high offset capability, low-noise measurements, and high-bandwidth power integrity analysis.
Mike is a Field Applications Engineering Manager and has worked for Teledyne LeCroy for over 25 years. He holds an MSEE from the University of Arizona and has been awarded 7 U.S. patents in oscilloscope measurement design.
This article explains how the oscilloscope Trend function differs from Track, and how it can be used for long-term measurement analysis, data logging, and monitoring evolving signal behavior across multiple acquisitions.
This article explains how the oscilloscope Track function can be used for anomaly detection and waveform demodulation by graphing synchronized measurement values directly against the input waveform.
This article explains how to properly configure an oscilloscope for ESD pulse testing, covering rise-time thresholds, EMC pulse measurements, parameter limiting, and automated trend capture for compliance testing.
This article explains how to properly configure an oscilloscope for EFT testing, covering sample rates, parameter acceptance, EMC pulse measurements, energy calculations, and efficient burst acquisition techniques.
This article explains how to properly configure an oscilloscope for surge testing, including attenuation setup, measurement threshold adjustments, and calculating pulse area and transferred charge.
Accurate ESD pulse measurement depends on using a high enough sampling rate to capture sufficient points on the rising edge for reliable characterization.
Accurate EMC/ESD testing begins with verifying surge and ESD pulse characteristics—such as rise time and bandwidth—using high-speed oscilloscopes before applying them to the DUT.
These nine practical DDR probing tips help reduce strain, improve signal integrity, and avoid common measurement pitfalls when working with high-speed DRAM interfaces.
