This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Steve is an Applications Engineer who most recently developed a remotely-accessible Test Engineering Lab. Steve’s 30-year Teledyne LeCroy career includes technical, marketing and sales roles. Steve enjoys bicycling, alpine skiing and camping.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Learn how oscilloscope histograms visualize measurement variation, identify distribution shapes, and quantify rare events in waveform timing and amplitude data.
This article explains how the inductance of passive probe ground leads can dramatically reduce effective bandwidth, distort measurements, and introduce resonance and frequency-response errors.
This tutorial explains a robust oscilloscope-based method for measuring clock jitter using period statistics, track and histogram analysis, and sample-rate verification techniques.
This article explains how oscilloscope Track functions can demodulate frequency- and phase-modulated RF signals by graphing instantaneous Frequency and TIE measurements over time.
Oscilloscope tools like measurement parameter tracking and histograms reveal how PWM pulse width, duty cycle, and modulation behavior change over time.
TDME oscilloscope software enables engineers to measure serial bus performance and convert encoded data into analog waveforms for deeper debugging and analysis.
