This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Educational materials about measurements of clock and serial data jitter using oscilloscopes. Understand the full range of jitter measurements along with time, statistical, frequency and phase-noise views of jitter with jitter deconvolution and extrapolation for advanced high-speed serial data applications.
This tutorial explains a robust oscilloscope-based method for measuring clock jitter using period statistics, track and histogram analysis, and sample-rate verification techniques.
