This article explains how the inductance of passive probe ground leads can dramatically reduce effective bandwidth, distort measurements, and introduce resonance and frequency-response errors.
This tutorial explains a robust oscilloscope-based method for measuring clock jitter using period statistics, track and histogram analysis, and sample-rate verification techniques.
This article introduces the RP2060 and RP4060 power rail probes, designed for modern 48 V power architectures with high offset capability, low-noise measurements, and high-bandwidth power integrity analysis.
Silicon and Wide-bandgap (GaN and SiC) power semiconductor devices and measurements, including double-pulse testing, switching loss, conduction loss, Rds ON, and a variety of other measurements to determine efficiency and efficacy of power semiconductor devices in circuit.
Power conversion relies on fast-switching MOSFETs and IGBTs that use low-voltage gate-drive signals to control high-voltage, high-current switching efficiently.
