This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Giuseppe is a Business Development Mgr and holds a Ph.D. in Electronic Engineering and Microwaves from Politecnico di Milano in Italy. His 35-year T&M career focus has been on EM fields, millimeter wave devices and high-speed serial data analysis.
