This article explains the expected behavior of on-die power rails during CMOS switching events, including PDN current flow, clock-edge noise, and asymmetric current draw between switching and latching operations.
Learn how oscilloscope histograms help characterize component specifications by comparing propagation delay, mean, standard deviation, and measurement spread under different conditions.
Mike has a BSEE from Montana State University, 25+ years in T&M, USB-IF honor roll recipient, and member of the USB-IF and VESA DisplayPort test working groups. Mike manages oscilloscope solutions for USB, Thunderbolt™ and DisplayPort™ technologies.
The TF-USB-C-HS enables synchronized electrical probing and protocol analysis to isolate USB 3.2 link training failures at both the PHY and logic layers.
Behind the simplicity of USB-C is a complex sequence of power negotiation, role detection, and multi-protocol link training that determines how devices communicate.
