Radar Signal Analysis With Oscilloscope Demodulation
Learn how oscilloscope demodulation and FFTs reveal radar pulse envelopes, Barker-coded phase modulation, chirp behavior, and frequency content.
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How Much Transmission-Line Loss is Too Much?
Transmission line loss directly affects eye diagram quality, with around −12 dB at Nyquist marking the limit before signal integrity rapidly degrades without equalization.
Secrets of the 10x Passive Probe Explained
Understanding the internal design of a 10x passive probe reveals the trade-offs that affect signal accuracy, bandwidth, and noise performance.
FFT on Oscilloscopes: Automatic Spectrum Analyzer Mode
Automatic FFT tools turn oscilloscopes into intuitive spectrum analyzers, simplifying setup while revealing key frequency components in real time.
Fast Fourier Transforms on Oscilloscopes: A Hands-On Guide
A hands-on approach to FFTs reveals how manual oscilloscope settings expose hidden frequency-domain details in seemingly simple signals.
Real-World FFT Analysis on Oscilloscope Signals
A practical FFT workflow reveals hidden frequency-domain insights in power supply noise that time-domain analysis alone cannot show.
Removing Reflections from DDR Signals Probed Mid-Bus
Virtual probing techniques can eliminate reflections in mid-bus DDR measurements, delivering cleaner signals and more accurate analysis.
Converting Single to Mixed-Mode S-Parameters
Mixed-mode S-parameters are derived from single-ended measurements through matrix transformations that reveal differential and common-mode signal behavior.
Introduction to Mixed-Mode S-parameters
Mixed-mode S-parameters provide a powerful framework for analyzing how differential and common signals interact in complex transmission systems.
Mode Conversion in Mixed-Mode S-Parameters Explained
Mode conversion in differential signaling is driven by asymmetry between signal paths, revealing itself through mixed-mode S-parameters.
Debugging Complex Embedded Systems
This introduction explores how to debug complex embedded systems by time-correlating diverse signals across power, digital, and analog domains.
Testing Power Rail Sequences in Complex Embedded Systems
This guide explains how to measure and validate power rail sequencing in embedded systems to ensure proper startup timing and long-term reliability.
Correlating Low to High-Speed Events in Complex Embedded Systems
This guide explains how to capture and correlate low- and high-speed events in embedded systems by balancing sample rate, memory depth, and measurement techniques.